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best phase

The random vibration test generates random vibration at an acceleration of 7.5 g rms, as defined by MIL-STD 883F, which simulates a harsh operating environment. Results are reported in terms of induced phase jitter in the time domain, calculated by integrating the induced phase noise over 15 Hz to 10 kHz offset frequency. The data shows SiTime’s MEMS oscillator is relatively immune to random vibration, outperforming all the other devices.

PTM Published on: 2017-01-18