It is important to understand how electronic components perform in the presence of shock. Because the frequency of oscillators can vary when exposed to shock, SiTime commissioned a third-party test lab to measure the effect of shock impact on oscillator performance using the test set-up shown on this slide. A continuous time interval analyzer (CTIA) was used to measure oscillator output frequency in 100 µs, time windows continuously for ten to fifteen seconds, and record the frequency deviation before, during, and after mechanical shock was applied to the oscillator in x, y, and z directions. The mechanical shock impulses were generated by test lab equipment per specifications of MIL-STD-883F, Method 2002 with 1 ms half sine wave shock pulse, and a peak acceleration of 500 g. This MIL standard is widely adopted for testing quartz crystal oscillator survivability under mechanical shock in non-operational mode. Most commercially available quartz crystal oscillators are specified in environmental qualification tests with levels of 100 g to 1500 g mechanical shock, while SiTime MEMS oscillators have achieved environmental qualification at >10,000 g.